@inproceedings{Moudgil:2013:NSC:2483028.2483049,
 author = {Moudgil, Rashmi and Ganta, Dinesh and Nazhandali, Leyla and Hsiao, Michael and Wang, Chao and Hall, Simin},
 title = {A novel statistical and circuit-based technique for counterfeit detection in existing ICs},
 booktitle = {Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI},
 series = {GLSVLSI '13},
 year = {2013},
 isbn = {978-1-4503-2032-0},
 location = {Paris, France},
 pages = {1--6},
 numpages = {6},
 url = {http://doi.acm.org/10.1145/2483028.2483049},
 doi = {10.1145/2483028.2483049},
 acmid = {2483049},
 publisher = {ACM},
 address = {New York, NY, USA},
 keywords = {aging, counterfeit, process variation},
}