@INPROCEEDINGS{6241501,
author={Koushanfar, F and Fazzari, S. and McCants, C. and Bryson, W. and Song, P. and Sale, M. and Potkonjak, M.},
booktitle={Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE},
title={Can EDA combat the rise of electronic counterfeiting?},
year={2012},
pages={133-138},
keywords={electronic design automation;integrated circuit packaging;integrated circuit reliability;integrated circuit testing;semiconductor industry;watermarking;EDA technologies;IP protection measures;SIA;US semiconductor companies;counterfeit detection tools;electronic counterfeiting;gray marketing;old IC repackaging;rapid post-silicon certification;semiconductor industry associates;Aging;Counterfeiting;Hardware;Integrated circuits;Logic gates;Stress;Threshold voltage;Counterfeiting;Device and IC aging;Reliability},
ISSN={0738-100X},}