@ARTICLE{5762649,
author={Griffin, W.P. and Raghunathan, A. and Roy, K.},
journal={Very Large Scale Integration (VLSI) Systems, IEEE Transactions on},
title={CLIP: Circuit Level IC Protection Through Direct Injection of Process Variations},
year={2012},
volume={20},
number={5},
pages={791-803},
keywords={cryptography;industrial property;integrated circuit design;program processors;reverse engineering;CLIP;area overheads;circuit level IC protection;correction points;cryptographic preprocessor;delay penalty;direct injection;injection points;integrated circuit piracy;manufacturing process;per-chip unlocking key;process variation sensors;process variations;reverse engineering;semiconductor design;semiconductor industry;test vectors;IP networks;Integrated circuits;Logic gates;Reverse engineering;Security;Sensors;Switches;Hardware security;integrated circuit (IC) piracy;process variations;reverse engineering},
doi={10.1109/TVLSI.2011.2135868},
ISSN={1063-8210},}