@INPROCEEDINGS{4542000,
author={Cui, A. and Chip-Hong Chang},
booktitle={Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on},
title={Intellectual property authentication by watermarking scan chain in design-for-testability flow},
year={2008},
pages={2645-2648},
keywords={VLSI;design for testability;digital signatures;industrial property;integrated circuit design;integrated circuit testing;logic design;watermarking;MCNC benchmarks;NP-hard problem;VLSI design flow;design-for-testability flow;digital signature;intellectual property authentication;ownership legitimacy;watermarking scan chain;Authentication;Design for testability;Digital signatures;Intellectual property;NP-hard problem;Power generation;Protection;Testing;Very large scale integration;Watermarking},
doi={10.1109/ISCAS.2008.4542000},}