@INPROCEEDINGS{5655082,
author={Bloom, G. and Narahari, B. and Simha, R.},
booktitle={Technologies for Homeland Security (HST), 2010 IEEE International Conference on},
title={Fab forensics: Increasing trust in IC fabrication},
year={2010},
pages={99-105},
keywords={failure analysis;integrated circuit design;IC designers;IC fabrication;as semiconductor fabrication facility;fab forensics;forensic information;light runtime system;rogue employees;trusted platform module;Forensics;IP networks;Integrated circuits;Runtime;Security;Software;Workstations},
doi={10.1109/THS.2010.5655082},}